主办：陕西省汽车工程学会
ISSN 1671-7988  CN 61-1394/TH
创刊：1976年
汽车实用技术

汽车实用技术 ›› 2025, Vol. 50 ›› Issue (5): 14-18.DOI: 10.16638/j.cnki.1671-7988.2025.005.003

• 新能源汽车 • 上一篇    

电动助力转向失效分析研究

李双锋，马国俊，毛锋   

  1. 易捷特新能源汽车有限公司研发中心
  • 发布日期:2025-03-12
  • 通讯作者: 李双锋
  • 作者简介:李双锋（1989－），男，工程师，研究方向为整车项目开发设计，E-mail:136287589@qq.com.cn

Research on Failure Analysis for Electric Power Steering

LI Shuangfeng, MA Guojun, MAO Feng   

  1. eGT New Energy Automotive Company Limited R&D Center
  • Published:2025-03-12
  • Contact: LI Shuangfeng

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摘要： 文章主要针对电动汽车出现的电动助力转向系统（EPS）失效故障，进行了电子故障失 效原因的排查。通过对电子控制单元（ECU）电路板各元器件进行芯片测试、功能确认、交 换试验和开发验证等一系列测试验证后，最终确定造成转向助力失效的原因为芯片内部电应 力失效。通过此次故障的分析，总结出了一套芯片故障导致电动助力转向的失效排查流程， 以及遇到此类问题的分析方法。文中所展示的芯片故障测试方案及参数的选择，为此类故障 提供了可靠的验证方案参考，同时针对导致芯片电应力失效的静电管控测试提供了参考标准。

关键词: 电动助力转向系统；芯片；电气过应力（EOS）；静电放电（ESD）

Abstract: This article mainly focuses on the electronic failure causes of electric power steering system (EPS) failures in electric vehicles. After a series of testing and verification, including chip testing, functional confirmation, exchange testing, and development validation, on various components of the electronic control unit (ECU) circuit board, it is finally determined that the cause of the failure of the steering assist is due to internal electrical stress failure of the chip. Through the analysis of this malfunction, a set of troubleshooting procedures for the failure of electric power steering caused by chip faults has been summarized, as well as analysis methods for encountering such problems. The chip fault testing scheme and parameter selection presented in the article provide a reliable verification scheme reference for such faults, and also provide reference standards for electrostatic control testing that causes chip electrical stress failure.

Key words: electric power steering system; chip; electrical over stress (EOS); electrostatic discharge (ESD)